Item type |
紀要論文 / Departmental Bulletin Paper(1) |
公開日 |
2008-05-02 |
タイトル |
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タイトル |
Atomic Structural Analysis of a Monolayer Epitaxial Film of Hexagonal Boron Nitride/Ni(111) studied by LEED Intensity Analysis(Interfaces by various techniques) |
言語 |
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言語 |
eng |
キーワード |
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主題Scheme |
Other |
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主題 |
h-BN |
キーワード |
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主題Scheme |
Other |
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主題 |
LEED analysis |
キーワード |
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主題Scheme |
Other |
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主題 |
epitaxial film |
キーワード |
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主題Scheme |
Other |
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主題 |
rumpling structure |
キーワード |
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主題Scheme |
Other |
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主題 |
monolayer |
資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
departmental bulletin paper |
ID登録 |
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ID登録 |
10.50974/00043821 |
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ID登録タイプ |
JaLC |
著者 |
Gamou, Yasuo
Terai, Masayuki
Nagashima, Ayato
Oshima, Chuhei
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抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
The atomic structure of a monolayer epitaxial film of hexagonal boron nitride (h-BN) formed on a Ni(111) surface was investigated by means of LEED intensity analysis. We measured the I-V curves of the (1, 0), (0, 1) and (1, 1) diffraction spots from a 1×1 atomic structure, and analyzed them by using Van Hove's analytical program based on dynamical theory. Six different atomic structural models meeting the experimental requirement of the 3-m symmetry were evaluated with Pendry's reliability factor. The final best-fit structure characterized by the minimum Pendry's reliability factor of 0.27 is as follows; the nitrogen atom in a unit cell of the h-BN overlayer is located at the on-top site of the topmost Ni atoms, while the boron atom exists at the fcc-hollow site. The spacings between the nitrogen (boron) atom and the topmost Ni layer is 2.04Å(2.2Å), which is much narrower than the interlayer spacing in bulk h-BN (3.33Å). |
書誌情報 |
Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy
巻 44,
号 2,
p. 211-214,
発行日 1997-03-31
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ISSN |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
00408808 |
書誌レコードID |
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収録物識別子タイプ |
NCID |
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収録物識別子 |
AA00836167 |
フォーマット |
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内容記述タイプ |
Other |
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内容記述 |
application/pdf |
著者版フラグ |
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出版タイプ |
VoR |
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出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
出版者 |
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出版者 |
Tohoku University |
資源タイプ |
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内容記述タイプ |
Other |
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内容記述 |
紀要類(bulletin) |
登録日 |
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日付 |
2008-05-02 |
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日付タイプ |
Created |
公開日(投稿完了日) |
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日付 |
2008-05-02 |
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日付タイプ |
Created |
発行日 |
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日付 |
1997-03-31 |
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日付タイプ |
Created |
フォーマット |
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内容記述タイプ |
Other |
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内容記述 |
394586 bytes |
更新日 |
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日付 |
2010-01-27 |
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日付タイプ |
Created |