@article{oai:tohoku.repo.nii.ac.jp:00012939,
 author = {Abe, K. and Aso, T. and Fujiwara, K. and Iwai, G. and Miyamoto, A. and Sugimoto, Y. and Takayama, H. and Tamura, N. and Terasawa, T. and Yamazaki, H.},
 journal = {核理研研究報告},
 month = {Nov},
 note = {application/pdf, CCD pixel sensors are expected to have very high performance as a charged particle tracking device because of the excellent spatial resolution and the very thin material thickness of the sensitive layer. One disadvantage of CCD sensors is its relatively low radiation hardness. We have exposed CCD samples to 140 MeV electron beam of LNS and studied their radiation tolerance. Comparing with the results of ^<90>Sr irradiation test, the energy dependence of the radiation damage has been clearly seen., 紀要類(bulletin), 352756 bytes},
 pages = {39--43},
 title = {Study of Radiation Damage of CCD Sensors by Electron Beam Irradiation(I. Nuclear Physics)},
 volume = {37},
 year = {2004}
}