{"created":"2023-07-27T04:40:03.092510+00:00","id":12939,"links":{},"metadata":{"_buckets":{"deposit":"bd9f32f7-6956-4e3c-b6f6-7776bbc2a102"},"_deposit":{"created_by":3,"id":"12939","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"12939"},"status":"published"},"_oai":{"id":"oai:tohoku.repo.nii.ac.jp:00012939","sets":["91:157"]},"author_link":["28707","28700","28701","28714","28713","28708","28698","28704","28709","28697","28710","28711","28699","28712","28705","28696","28715","28703","28706","28702"],"item_4_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-11","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"43","bibliographicPageStart":"39","bibliographicVolumeNumber":"37","bibliographic_titles":[{"bibliographic_title":"核理研研究報告"}]}]},"item_4_date_62":{"attribute_name":"登録日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-02","subitem_date_issued_type":"Created"}]},"item_4_date_63":{"attribute_name":"公開日（投稿完了日）","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-02","subitem_date_issued_type":"Created"}]},"item_4_date_65":{"attribute_name":"発行日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2004-11","subitem_date_issued_type":"Created"}]},"item_4_date_80":{"attribute_name":"更新日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2010-01-27","subitem_date_issued_type":"Created"}]},"item_4_description_15":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_4_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"CCD pixel sensors are expected to have very high performance as a charged particle tracking device because of the excellent spatial resolution and the very thin material thickness of the sensitive layer. One disadvantage of CCD sensors is its relatively low radiation hardness. We have exposed CCD samples to 140 MeV electron beam of LNS and studied their radiation tolerance. Comparing with the results of ^<90>Sr irradiation test, the energy dependence of the radiation damage has been clearly seen.","subitem_description_type":"Abstract"}]},"item_4_description_41":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"紀要類(bulletin)","subitem_description_type":"Other"}]},"item_4_description_66":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"352756 bytes","subitem_description_type":"Other"}]},"item_4_full_name_2":{"attribute_name":"著者(ヨミ)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"28706","nameIdentifierScheme":"WEKO"}],"names":[{"name":"阿部, 浩也"}]},{"nameIdentifiers":[{"nameIdentifier":"28707","nameIdentifierScheme":"WEKO"}],"names":[{"name":"阿蘇, 司"}]},{"nameIdentifiers":[{"nameIdentifier":"28708","nameIdentifierScheme":"WEKO"}],"names":[{"name":"藤原,  康平"}]},{"nameIdentifiers":[{"nameIdentifier":"28709","nameIdentifierScheme":"WEKO"}],"names":[{"name":"岩井,  剛"}]},{"nameIdentifiers":[{"nameIdentifier":"28710","nameIdentifierScheme":"WEKO"}],"names":[{"name":"宮本, 彰也"}]},{"nameIdentifiers":[{"nameIdentifier":"28711","nameIdentifierScheme":"WEKO"}],"names":[{"name":"杉本, 康博"}]},{"nameIdentifiers":[{"nameIdentifier":"28712","nameIdentifierScheme":"WEKO"}],"names":[{"name":"高山, 広也"}]},{"nameIdentifiers":[{"nameIdentifier":"28713","nameIdentifierScheme":"WEKO"}],"names":[{"name":"田村,  詔生"}]},{"nameIdentifiers":[{"nameIdentifier":"28714","nameIdentifierScheme":"WEKO"}],"names":[{"name":"寺沢,  辰生"}]},{"nameIdentifiers":[{"nameIdentifier":"28715","nameIdentifierScheme":"WEKO"}],"names":[{"name":"山崎,  寛仁"}]}]},"item_4_publisher_34":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東北大学理学部附属原子核理学研究施設"}]},"item_4_radio_69":{"attribute_name":"公開範囲","attribute_value_mlt":[{"subitem_radio_item":"学外"}]},"item_4_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03852105","subitem_source_identifier_type":"ISSN"}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN0003958X","subitem_source_identifier_type":"NCID"}]},"item_4_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Abe, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Aso, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujiwara, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwai, G."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Miyamoto, A."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sugimoto, Y."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takayama, H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tamura, N."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Terasawa, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamazaki, H."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-03"}],"displaytype":"detail","filename":"KJ00004174822.pdf","filesize":[{"value":"352.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004174822.pdf","url":"https://tohoku.repo.nii.ac.jp/record/12939/files/KJ00004174822.pdf"},"version_id":"44a9064f-0ac7-4334-b898-acf69105205d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Study of Radiation Damage of CCD Sensors by Electron Beam Irradiation(I. Nuclear Physics)","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Study of Radiation Damage of CCD Sensors by Electron Beam Irradiation(I. Nuclear Physics)"}]},"item_type_id":"4","owner":"3","path":["157"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-05-02"},"publish_date":"2008-05-02","publish_status":"0","recid":"12939","relation_version_is_last":true,"title":["Study of Radiation Damage of CCD Sensors by Electron Beam Irradiation(I. Nuclear Physics)"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-07-27T11:55:33.100758+00:00"}