{"created":"2023-07-27T04:46:35.198283+00:00","id":47135,"links":{},"metadata":{"_buckets":{"deposit":"9ca5e438-956a-4074-9458-21296037bd2f"},"_deposit":{"created_by":3,"id":"47135","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"47135"},"status":"published"},"_oai":{"id":"oai:tohoku.repo.nii.ac.jp:00047135","sets":["76:267"]},"author_link":["111054","111055","111053","111052"],"item_4_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-03-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"244","bibliographicPageStart":"239","bibliographicVolumeNumber":"42","bibliographic_titles":[{"bibliographic_title":"Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy"}]}]},"item_4_date_62":{"attribute_name":"登録日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-02","subitem_date_issued_type":"Created"}]},"item_4_date_63":{"attribute_name":"公開日（投稿完了日）","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-02","subitem_date_issued_type":"Created"}]},"item_4_date_65":{"attribute_name":"発行日","attribute_value_mlt":[{"subitem_date_issued_datetime":"1996-03-28","subitem_date_issued_type":"Created"}]},"item_4_date_80":{"attribute_name":"更新日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2010-01-27","subitem_date_issued_type":"Created"}]},"item_4_description_15":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_4_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An in-house grazing incidence X-ray scattering (GIXS) apparatus has been newly built for studying a liquid surface and a liquid/solid or liquid/liquid interface. This apparatus consists of a high flux rotating anode x-ray generator, pairs of slits for incident and diffracted beams, a channel-cut Ge 440 crystal monochromator and a double-axis diffractometer. The capability of this system was tested by measuring the reflection profiles from a water surface and an interface of water and mercury-electrode.","subitem_description_type":"Abstract"}]},"item_4_description_41":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"紀要類(bulletin)","subitem_description_type":"Other"}]},"item_4_description_66":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"907884 bytes","subitem_description_type":"Other"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.50974/00043698","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_34":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Tohoku University"}]},"item_4_radio_69":{"attribute_name":"公開範囲","attribute_value_mlt":[{"subitem_radio_item":"学外"}]},"item_4_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00408808","subitem_source_identifier_type":"ISSN"}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00836167","subitem_source_identifier_type":"NCID"}]},"item_4_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sato, Shigeo"}],"nameIdentifiers":[{"nameIdentifier":"111052","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saito, Masatoshi"}],"nameIdentifiers":[{"nameIdentifier":"111053","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsubara, Eiichiro"}],"nameIdentifiers":[{"nameIdentifier":"111054","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Waseda, Yoshio"}],"nameIdentifiers":[{"nameIdentifier":"111055","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-16"}],"displaytype":"detail","filename":"KJ00004200718.pdf","filesize":[{"value":"907.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004200718.pdf","url":"https://tohoku.repo.nii.ac.jp/record/47135/files/KJ00004200718.pdf"},"version_id":"1227887c-3974-4413-bf4f-14d338166c99"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"GIXS","subitem_subject_scheme":"Other"},{"subitem_subject":"x-ray reflectivity","subitem_subject_scheme":"Other"},{"subitem_subject":"liquid surface","subitem_subject_scheme":"Other"},{"subitem_subject":"liquid/liquid interface","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"New In-House Grazing Incident X-ray Scattering (GIXS) Apparatus for Studying Liquid Surface and Interface","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"New In-House Grazing Incident X-ray Scattering (GIXS) Apparatus for Studying Liquid Surface and Interface"}]},"item_type_id":"4","owner":"3","path":["267"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-05-02"},"publish_date":"2008-05-02","publish_status":"0","recid":"47135","relation_version_is_last":true,"title":["New In-House Grazing Incident X-ray Scattering (GIXS) Apparatus for Studying Liquid Surface and Interface"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-07-27T14:22:51.801811+00:00"}