{"created":"2023-07-27T04:46:40.204625+00:00","id":47253,"links":{},"metadata":{"_buckets":{"deposit":"e66554bc-4d1e-44c3-ac2d-4efccdd084a0"},"_deposit":{"created_by":3,"id":"47253","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"47253"},"status":"published"},"_oai":{"id":"oai:tohoku.repo.nii.ac.jp:00047253","sets":["76:267"]},"author_link":["111541"],"item_4_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1997-03-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"185","bibliographicPageStart":"181","bibliographicVolumeNumber":"44","bibliographic_titles":[{"bibliographic_title":"Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy"}]}]},"item_4_date_62":{"attribute_name":"登録日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-02","subitem_date_issued_type":"Created"}]},"item_4_date_63":{"attribute_name":"公開日（投稿完了日）","attribute_value_mlt":[{"subitem_date_issued_datetime":"2008-05-02","subitem_date_issued_type":"Created"}]},"item_4_date_65":{"attribute_name":"発行日","attribute_value_mlt":[{"subitem_date_issued_datetime":"1997-03-31","subitem_date_issued_type":"Created"}]},"item_4_date_80":{"attribute_name":"更新日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2010-01-27","subitem_date_issued_type":"Created"}]},"item_4_description_15":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_4_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We demonstrate that a novel method of current-voltage (I-V) spectra measurement by scanning force microscopy (SFM) reveals subsurface local electrical characteristics of resonant tunneling diodes (RTDs) on a nanometer scale. Measured SFM I-V spectra of RTDs show negative differential resistance features, and the spatial resolution of this method was found to be 20 nm. Experimental evidence for the quantized nature of an SFM pointcontact was observed for the first time. High spatial resolution of this method was confirmed by a simple calculation for the area of current flow through RTD.","subitem_description_type":"Abstract"}]},"item_4_description_41":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"紀要類(bulletin)","subitem_description_type":"Other"}]},"item_4_description_66":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"623242 bytes","subitem_description_type":"Other"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.50974/00043816","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_34":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Tohoku University"}]},"item_4_radio_69":{"attribute_name":"公開範囲","attribute_value_mlt":[{"subitem_radio_item":"学外"}]},"item_4_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00408808","subitem_source_identifier_type":"ISSN"}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00836167","subitem_source_identifier_type":"NCID"}]},"item_4_version_type_16":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tanimoto, Masafumi"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-02-16"}],"displaytype":"detail","filename":"KJ00004200853.pdf","filesize":[{"value":"623.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004200853.pdf","url":"https://tohoku.repo.nii.ac.jp/record/47253/files/KJ00004200853.pdf"},"version_id":"fdaf1e90-4aca-4183-a919-4e2e7ac25557"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"scanning force microscopy","subitem_subject_scheme":"Other"},{"subitem_subject":"resonant tunneling diode","subitem_subject_scheme":"Other"},{"subitem_subject":"negative difference resistance","subitem_subject_scheme":"Other"},{"subitem_subject":"quantized point contact","subitem_subject_scheme":"Other"},{"subitem_subject":"subsurface","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"SFM-IV Method for Characterizing Sub-Surface Interfaces of Semiconductor Devices(Interfaces by various techniques)","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"SFM-IV Method for Characterizing Sub-Surface Interfaces of Semiconductor Devices(Interfaces by various techniques)"}]},"item_type_id":"4","owner":"3","path":["267"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-05-02"},"publish_date":"2008-05-02","publish_status":"0","recid":"47253","relation_version_is_last":true,"title":["SFM-IV Method for Characterizing Sub-Surface Interfaces of Semiconductor Devices(Interfaces by various techniques)"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-07-27T14:23:42.216315+00:00"}