@article{oai:tohoku.repo.nii.ac.jp:00053586,
 author = {Kobayashi, Kiyoteru and Teramoto, Akinobu and Miyoshi, Hirokazu},
 issue = {5},
 journal = {IEEE Transactions on Electron Devices},
 month = {May},
 note = {application/pdf, 学術論文 (Article), 197471 bytes},
 pages = {947--953},
 title = {Origin of positive charge generated in thin SiO2 films during high-field electrical stress},
 volume = {46},
 year = {1999}
}