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  1. 400 金属材料研究所
  2. 東北大学研究所報告. A集, 物理学・化学・冶金学

The Intensity of Satellite Reflections in Electron Diffraction Patterns from Evaporated Alloy Films with CuAu II Type Superstructure

http://hdl.handle.net/10097/27243
http://hdl.handle.net/10097/27243
ffc75d48-2948-45db-b9b1-5b165310070c
名前 / ファイル ライセンス アクション
KJ00004197337.pdf KJ00004197337.pdf (43.6 kB)
Item type 紀要論文 / Departmental Bulletin Paper(1)
公開日 2008-05-02
タイトル
タイトル The Intensity of Satellite Reflections in Electron Diffraction Patterns from Evaporated Alloy Films with CuAu II Type Superstructure
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ departmental bulletin paper
著者 FUJIME, Satoru

× FUJIME, Satoru

FUJIME, Satoru

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WATANABE, Denjiro

× WATANABE, Denjiro

WATANABE, Denjiro

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OGAWA, Shiro

× OGAWA, Shiro

OGAWA, Shiro

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FUJIWARA, Kunio

× FUJIWARA, Kunio

FUJIWARA, Kunio

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MIYAKE, Shizuo

× MIYAKE, Shizuo

MIYAKE, Shizuo

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抄録
内容記述タイプ Abstract
内容記述 In order to elucidate the origin of satellite reflections flanking the direct spot in the electron diffraction pattern of a single crystal evaporated film with CuAu II type superlattice, the peak as well as integrated intensities have been measured as functions of the wavelength of electrons corresponding to the accelerating voltage from 75 to 280KV. It has been revealed that the intensity of the satellite in question relative to a fundamental reflection consists of two parts, a major part which depends on the wavelength in such a way as predicted by the theory of multiple reflection, and the other minor part which is independent of the wavelength. The existence of the latter part shows that the reflection is not a forbidden one and, therefore, a lattice modulation accompanies the regular anti-phase structure. Fourier potential due to this lattice modulation, V_s, is estimated to be in the order of one tenth the magnitude of V_<400> Some consideration concerning the nature of the modulation is given by comparing the results of electron and X-ray diffraction studies.
書誌情報 Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy

巻 17, p. 172-172, 発行日 1965
ISSN
収録物識別子タイプ ISSN
収録物識別子 00408808
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA00836167
フォーマット
内容記述タイプ Other
内容記述 application/pdf
著者版フラグ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
出版者
出版者 Tohoku University
資源タイプ
内容記述タイプ Other
内容記述 紀要類(bulletin)
登録日
日付 2008-05-02
日付タイプ Created
公開日(投稿完了日)
日付 2008-05-02
日付タイプ Created
発行日
日付 1965
日付タイプ Created
フォーマット
内容記述タイプ Other
内容記述 43598 bytes
更新日
日付 2010-01-27
日付タイプ Created
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Cite as

FUJIME, Satoru, WATANABE, Denjiro, OGAWA, Shiro, FUJIWARA, Kunio, MIYAKE, Shizuo, 1965, The Intensity of Satellite Reflections in Electron Diffraction Patterns from Evaporated Alloy Films with CuAu II Type Superstructure: Tohoku University, 172–172 p.

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