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The Intensity of Satellite Reflections in Electron Diffraction Patterns from Evaporated Alloy Films with CuAu II Type Superstructure
http://hdl.handle.net/10097/27243
http://hdl.handle.net/10097/27243ffc75d48-2948-45db-b9b1-5b165310070c
名前 / ファイル | ライセンス | アクション |
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||||||||||||
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公開日 | 2008-05-02 | |||||||||||||||
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タイトル | The Intensity of Satellite Reflections in Electron Diffraction Patterns from Evaporated Alloy Films with CuAu II Type Superstructure | |||||||||||||||
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言語 | eng | |||||||||||||||
資源タイプ | ||||||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||
資源タイプ | departmental bulletin paper | |||||||||||||||
著者 |
FUJIME, Satoru
× FUJIME, Satoru
× WATANABE, Denjiro
× OGAWA, Shiro
× FUJIWARA, Kunio
× MIYAKE, Shizuo
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内容記述タイプ | Abstract | |||||||||||||||
内容記述 | In order to elucidate the origin of satellite reflections flanking the direct spot in the electron diffraction pattern of a single crystal evaporated film with CuAu II type superlattice, the peak as well as integrated intensities have been measured as functions of the wavelength of electrons corresponding to the accelerating voltage from 75 to 280KV. It has been revealed that the intensity of the satellite in question relative to a fundamental reflection consists of two parts, a major part which depends on the wavelength in such a way as predicted by the theory of multiple reflection, and the other minor part which is independent of the wavelength. The existence of the latter part shows that the reflection is not a forbidden one and, therefore, a lattice modulation accompanies the regular anti-phase structure. Fourier potential due to this lattice modulation, V_s, is estimated to be in the order of one tenth the magnitude of V_<400> Some consideration concerning the nature of the modulation is given by comparing the results of electron and X-ray diffraction studies. | |||||||||||||||
書誌情報 |
Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy 巻 17, p. 172-172, 発行日 1965 |
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収録物識別子タイプ | ISSN | |||||||||||||||
収録物識別子 | 00408808 | |||||||||||||||
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収録物識別子タイプ | NCID | |||||||||||||||
収録物識別子 | AA00836167 | |||||||||||||||
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内容記述タイプ | Other | |||||||||||||||
内容記述 | application/pdf | |||||||||||||||
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出版タイプ | VoR | |||||||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||
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出版者 | Tohoku University | |||||||||||||||
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内容記述タイプ | Other | |||||||||||||||
内容記述 | 紀要類(bulletin) | |||||||||||||||
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日付 | 2008-05-02 | |||||||||||||||
日付タイプ | Created | |||||||||||||||
公開日(投稿完了日) | ||||||||||||||||
日付 | 2008-05-02 | |||||||||||||||
日付タイプ | Created | |||||||||||||||
発行日 | ||||||||||||||||
日付 | 1965 | |||||||||||||||
日付タイプ | Created | |||||||||||||||
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内容記述タイプ | Other | |||||||||||||||
内容記述 | 43598 bytes | |||||||||||||||
更新日 | ||||||||||||||||
日付 | 2010-01-27 | |||||||||||||||
日付タイプ | Created |
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Cite as
FUJIME, Satoru, WATANABE, Denjiro, OGAWA, Shiro, FUJIWARA, Kunio, MIYAKE, Shizuo, 1965, The Intensity of Satellite Reflections in Electron Diffraction Patterns from Evaporated Alloy Films with CuAu II Type Superstructure: Tohoku University, 172–172 p.
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